2193) Compression Test of Pin-Supported Plates
نویسندگان
چکیده
منابع مشابه
Combining Low Pin Count Test with Scan Compression Dramatically Reduces Test Interface and Cost
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ژورنال
عنوان ژورنال: Transactions of the Architectural Institute of Japan Summaries of Technical Papers
سال: 1965
ISSN: 2433-0035
DOI: 10.3130/aijsaxxe.40.0_305